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Journal Articles Journal of Applied Crystallography Year : 2015

XTOP: high-resolution X-ray diffraction and imaging

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emse-01500752 , version 1 (03-04-2017)

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Vincent Favre-Nicolin, Jose Baruchel, Hubert Renevier, Joel Eymery, Andras Borbely. XTOP: high-resolution X-ray diffraction and imaging. Journal of Applied Crystallography, 2015, 48 (Part : 3), pp.620-620. ⟨10.1107/S160057671500895X⟩. ⟨emse-01500752⟩
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