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XTOP: high-resolution X-ray diffraction and imaging

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https://hal-emse.ccsd.cnrs.fr/emse-01500752
Contributor : Géraldine Fournier-Moulin <>
Submitted on : Monday, April 3, 2017 - 4:10:40 PM
Last modification on : Tuesday, September 15, 2020 - 10:26:04 PM

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Vincent Favre-Nicolin, Jose Baruchel, Hubert Renevier, Joel Eymery, Andras Borbely. XTOP: high-resolution X-ray diffraction and imaging. Journal of Applied Crystallography, International Union of Crystallography, 2015, 48 (Part : 3), pp.620-620. ⟨10.1107/S160057671500895X⟩. ⟨emse-01500752⟩

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