Laser testing of a double-access BBICS architecture with improved SEE detection capabilities - Mines Saint-Étienne
Conference Papers Year : 2016

Laser testing of a double-access BBICS architecture with improved SEE detection capabilities

Abstract

The paper reports the experimental validation of a new Bulk Built-In Current Sensor (BBICS) designed and implemented in a 40nm CMOS technology. The double-access architecture provides improved SEE detection as confirmed by laser experiments.

Domains

Micro and nanotechnologies/Microelectronics
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Jean-Max Dutertre  : Connect in order to contact the contributor

https://hal-emse.ccsd.cnrs.fr/emse-01855833

Submitted on : Wednesday, August 8, 2018-3:56:16 PM

Last modification on : Tuesday, September 24, 2024-10:18:14 AM

Long-term archiving on : Friday, November 9, 2018-1:23:50 PM

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Dates and versions

emse-01855833 , version 1 (08-08-2018)

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Clément Champeix, Jean-Max Dutertre, Vincent Pouget, Bruno Robisson, Mathieu Lisart, et al.. Laser testing of a double-access BBICS architecture with improved SEE detection capabilities. 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2016, Bremen, Germany. ⟨10.1109/RADECS.2016.8093172⟩. ⟨emse-01855833⟩

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