ElectroMagnetic Analysis and Fault Injection onto Secure Circuits

Implementation attacks are a major threat to hardware cryptographic implementations. These attacks exploit the correlation existing between the computed data and variables such as computation time, consumed power, and electromagnetic (EM) emissions. Recently, the EM channel has been proven as an effective passive and active attack technique against secure implementations. In this paper, we review the recent results obtained on this subject, with a particular focus on EM as a fault injection tool.

Keywords

EM injection Fault Attack Fault Injection

Domains

Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

Fichier principal

hal_VLSI_SoC_2015_ElectroMagnetic_Analysis_and_Fault_Injection_onto_Secure_Circuits.pdf (1.88 Mo)

P_2014_5_talk_VLSI_SoC_em_injection.pdf (4.85 Mo)

Origin	Files produced by the author(s)

Origin	Files produced by the author(s)

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https://hal-emse.ccsd.cnrs.fr/emse-01099025

Submitted on : Friday, November 27, 2015-1:43:51 PM

Last modification on : Tuesday, September 17, 2024-3:45:47 PM

Long-term archiving on : Saturday, April 29, 2017-1:42:44 AM

Dates and versions

emse-01099025 , version 1 (27-11-2015)

Identifiers

HAL Id : emse-01099025 , version 1
DOI : 10.1109/VLSI-SoC.2014.7004182

Cite

Paolo Maistri, Régis Leveugle, Lilian Bossuet, Alain Aubert, Viktor Fischer, et al.. ElectroMagnetic Analysis and Fault Injection onto Secure Circuits. VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Mexico, Mexico. ⟨10.1109/VLSI-SoC.2014.7004182⟩. ⟨emse-01099025⟩

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