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On the Use of Forward Body Biasing to Decrease the Repeatability of Laser-Induced Faults

Abstract : This paper presents a study on the effect of Forward Body Biasing on the laser fault sensitivity of a CMOS 90nm microcontroller. Tests were performed on a register of this target, under several supply voltage and body-bias settings, showing significant laser sensitivity variations. Based on these results, a method which aims at decreasing fault repeatability by using variable supply voltage and body-bias settings is proposed. Finally, tests are performed on an implementation of this method on a temporally redundant AES and the results are presented.
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https://hal-emse.ccsd.cnrs.fr/emse-01855866
Contributor : Jean-Max Dutertre <>
Submitted on : Friday, August 17, 2018 - 11:57:00 AM
Last modification on : Wednesday, June 24, 2020 - 4:18:24 PM
Long-term archiving on: : Sunday, November 18, 2018 - 12:49:04 PM

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  • HAL Id : emse-01855866, version 1

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Marc Lacruche, Noemie Beringuier-Boher, Jean-Max Dutertre, Jean-Baptiste Rigaud, Edith Kussener. On the Use of Forward Body Biasing to Decrease the Repeatability of Laser-Induced Faults. 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2016, Dresde, Germany. ⟨emse-01855866⟩

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