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Conference Papers Year : 2016

On the Use of Forward Body Biasing to Decrease the Repeatability of Laser-Induced Faults

Abstract

This paper presents a study on the effect of Forward Body Biasing on the laser fault sensitivity of a CMOS 90nm microcontroller. Tests were performed on a register of this target, under several supply voltage and body-bias settings, showing significant laser sensitivity variations. Based on these results, a method which aims at decreasing fault repeatability by using variable supply voltage and body-bias settings is proposed. Finally, tests are performed on an implementation of this method on a temporally redundant AES and the results are presented.
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Dates and versions

emse-01855866 , version 1 (17-08-2018)

Identifiers

  • HAL Id : emse-01855866 , version 1

Cite

Marc Lacruche, Noemie Beringuier-Boher, Jean-Max Dutertre, Jean-Baptiste Rigaud, Edith Kussener. On the Use of Forward Body Biasing to Decrease the Repeatability of Laser-Induced Faults. 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2016, Dresde, Germany. ⟨emse-01855866⟩
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