Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts

Abstract : Bulk Built-In Current Sensors (BBICS) are fault detection mechanisms embedded in integrated systems. BBICS are able to monitor anomalous transient currents like the so-called single event effects induced by radiation or even malicious injection sources. This work reviews BBICS principles and introduce new sensor architectures that improve the transient-fault detection sensitivity. In addition, a test chip is presented for the validation of the sensor concept under the laser-induced effects.
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https://hal-emse.ccsd.cnrs.fr/emse-01099040
Contributor : Jean-Max Dutertre <>
Submitted on : Wednesday, January 7, 2015 - 2:28:48 PM
Last modification on : Thursday, February 7, 2019 - 2:22:54 PM
Long-term archiving on : Wednesday, June 3, 2015 - 12:45:13 PM

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  • HAL Id : emse-01099040, version 1

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Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Giorgio Di Natale, et al.. Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts. Joint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands. 2014. ⟨emse-01099040⟩

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