Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts

Abstract : Bulk Built-In Current Sensors (BBICS) are fault detection mechanisms embedded in integrated systems. BBICS are able to monitor anomalous transient currents like the so-called single event effects induced by radiation or even malicious injection sources. This work reviews BBICS principles and introduce new sensor architectures that improve the transient-fault detection sensitivity. In addition, a test chip is presented for the validation of the sensor concept under the laser-induced effects.
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Poster
Joint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands
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https://hal-emse.ccsd.cnrs.fr/emse-01099040
Contributeur : Jean-Max Dutertre <>
Soumis le : mercredi 7 janvier 2015 - 14:28:48
Dernière modification le : jeudi 9 août 2018 - 12:04:02
Document(s) archivé(s) le : mercredi 3 juin 2015 - 12:45:13

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  • HAL Id : emse-01099040, version 1

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Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Giorgio Di Natale, et al.. Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts . Joint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands. 〈emse-01099040〉

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